Thickness Measurement Device

emum-filmetrics

Brand / Model

Filmetrics / F20

Features

Thickness Range: 15 nm – 70 μm
Wavelength Range: 380 – 1050 nm

Aim

It is used to measurement of the thickness
and optical constants (n and k) of dielectric
and semiconductor thin films.

 

 

Terms of sample delivery: 

 

 

Contact: 

Click here for EMUM price list.
Click here for letter of application for industrial service.

Authorized: Cesim Narmanoğlu – Sample Acceptance Unit | Phone:+90 232 301 90 10 | E-mail: cesim.narmanoglu@deu.edu.tr

EMUM Secretary | Phone: 0232 301 90 01 | E-mail: emum@deu.edu.tr