X-Ray Photoelectron Spectroscopy (XPS)

Brand / Model

Thermo Scientific K-Alpha


Analyzer: 180° double focusing hemispherical
Detector: 128-channel
Monochromator: Al Kα micro-focused
Variable spot size: 30-400 μm in 5 μm steps
Beam source: Dual source
Electron beam: Ultra-low energy
Data system: Avantage
Ion gun energy range: 100 eV – 4 keV
Sample stage: 4-axis
Sample area: 60 × 60 mm
Max. sample thickness: 20 mm
Pump system: 2 x 260 l/s turbomolecular pumps
for entry and analysis chambers


X-ray Photoelectron Spectroscopy (XPS) is a highly surface-sensitive, quantitative, chemical analysis technique. XPS is the measurement of photoelectrons ejected from the surface of a material which has been irradiated with X-rays. The kinetic energy of the emitted photoelectrons is measured, which is directly related to their binding energy within the parent atom; this is characteristic of the element and its chemical state. Only electrons generated near the surface can escape without losing too much energy for detection; this means that XPS data is collected from the top few nanometers of the surface.

Terms of Sample Delivery:



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Authorized: Cesim Narmanoğlu – Sample Acceptance Unit | Phone: +90 232 301 90 10 | E-mail: cesim.narmanoglu@deu.edu.tr

EMUM Secretary | Phone: +90 232 301 90 01 | E-mail: emum@deu.edu.tr