Features

X-ray source: Cu-Kα with Ni filter
Source voltage: 15 – 60 kV
Sourve current: 5 – 60 mA
Normal scanning speed: (0.1° 2θ/s)
Scanning range: 0 – 89° (2-Theta)
Max. voltage and current: 60 kV, 55 mA
Angular resolution: <0.04° FWHM
Sample:
Powder: 150 mg
Solid and thin film: Min. 0.5 x 0, 5 cm
Max. 2 x 2 cm

Aim

The X-Ray Diffraction Method (XRD) is based on the fact that each crystalline phase breaks X-rays in a characteristic order, depending on the specific atomic sequences of the phase. For each crystal phase, these diffraction profiles quantitatively define that crystal. The X-ray diffraction analysis method does not destroy the sample during the analysis and allows for the analysis of even small amounts of samples. With the XRD device, it is possible to perform phase analysis (search match) and texture analysis together with the diffraction profiles of the samples.