Features

Magnetic Field: 0 – 3,5 T
Magnetic Moment: 10-2 emu – 300 emu
Temperature Range: -196 – 900°C
Sample:
Powder: Min. 300 mg
Solid: Maks. 4 x 4 x 6 mm
Liquid: Min. 5 mL

Aim

The VSM can be used for the measurement of the basic magnetic properties of the materials such as the hysteresis loops of the materials, the magnetization curve and the warming / cooling curve. In addition, some parameters such as the saturated strength of the magnetization, the left strength of the magnetization, the coercive force, the maximum of magnetic energy product, the Curie temperature and the magnetic conductivity can also be obtained.

Features

Resistivity Range: 10-4 to 107 Ohms/cm
Magnet: Permanent (çap: 50 mm)
Magnet Flux Density: 0,55 T nominal
Current Source: 1 nA – 20 mA
Mobility: 1 – 107 cm2/Volt.sn
Density: 107 ~ 1021 cm-3
Voltage: ± 12 V

Aim

It is used to determination of measurement of the resistivity, carrier concentration, P/N type, mobility of various materials and I – V curve for various materials.

Features

Function: A / R / V measurement,
A / V Source:
Voltage Range: ±200 mV – ±200 V
Current Range: ±1 nA – ±10 A
Resistance Range: 500 n.ohm – 10 p.ohm

Features

Probes: Four point
Mounting chuck diameter: 150 mm

Aim

It is used to measure the coating resistivity in samples with a flat surface.

Features

Thickness Range: 15 nm – 70 μm
Wavelength Range: 380 – 1050 nm

Aim

It is used to measurement of the thickness and optical constants (n and k) of dielectric and semiconductor thin films.

Features

Bandwidth: 300 kHz – 13,5 GHz
2 ports
Rec. Dynamic Range: 110 dB system
122 dB – 32,001 points,
32 channels
< .006 dB rms
Meas. Speed: 4 – 9 μs per point