Atomic Force Microscopy (AFM)

emum-afm

Brand / Model

DME Tools DS 95-50

Features

Scanner Modes: Contact mode (DC),
intermittent mode (AC)
Scan range: 50 μm x 50 μm x 5 μm
Noise Level: < 0.05 nm rms
in vertical direction (Z)
Scan Speed: Up to 100 μm/s
Min. amp. setting: < 1 nm (in AC mode)

Aim

It provides high-resolution, three-dimensional
visualization of the surface by means
of a needle tip pointed to atomic dimensions.
Imaging is performed as a result of
examining the interaction of the needle tip
with the surface.

 

 

Terms of sample delivery: 

 

 

Contact: 

Click here for EMUM price list.
Click here for letter of application for industrial service.

Authorized: Cesim Narmanoğlu – Sample Acceptance Unit | Phone:+90 232 301 90 10 | E-mail: cesim.narmanoglu@deu.edu.tr

EMUM Secretary | Phone: 0232 301 90 01 | E-mail: emum@deu.edu.tr