Atomic Force Microscopy (AFM)
Brand / Model
Nanosurf NaioAFM
Features
Display modes: Static Force, Dynamic Force, Phase
Contrast, MFM, EFM
Maximum scanning range: 70 μm (1.0 nm)
Scanning height (resolution): 14 μm (0.2 nm)
Max. specimen size / height: 12 mm / 3.5 mm
Noise Level (Static/Dynamic RMS Z) : 0.4 nm (max 0.8 nm) / 0.3 nm (max 0.8 nm)
Aim
It enables high-resolution, three-dimensional imaging of the surface using a needle tip sharpened to atomic size. Imaging is performed by examining the interaction of the needle tip with the surface.
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